Perform interactive global or localized thickness analysis based on surface or profile pairs.
⇒ Align surface or profile pairs – create a “thickness pair” by aligning any two surfaces or profiles using manual or semi-automated alignment tools. Adjust the lower layer to match the position and orientation of the upper layer—enabling accurate thickness measurement regardless of the microscope or profiler used.
⇒ Support for optical and confocal microscopy data – handle multilayer scans from optical or confocal microscopes, allowing observation through transparent or semi-transparent materials such as coatings.
⇒ Interactive thickness analysis – measure thickness dynamically between upper and lower layers.
⇒ Generate global thickness statistics – compute comprehensive thickness parameters including mean, minimum, maximum, standard deviation, skewness, kurtosis, and more.
⇒ Calculate localized parameters – assess thickness at a specific point, along a line, or within defined zones.
⇒ Tolerance-based evaluation – set minimum and maximum thickness limits to easily pinpoint areas out of specification—especially useful for applications requiring uniform thickness such as varnishing, coatings, coin minting, security printing, or membrane sealing.
⇒ 3D thickness visualization – create visually rich 3D renderings of thickness distribution.
⇒ Cross-sectional analysis – extract two-profile 2D cross-sections of membranes for interactive measurement and comparison.
Included in:
- MountainsMap® Premium
- MountainsLab® Premium
Available with:
- MountainsMap® Topography
- MountainsMap® Imaging Topography
- MountainsMap® Expert
- MountainsSEM® Expert
- MountainsSEM® Premium
- MountainsLab® Expert
