Different research and industrial projects require different tools and techniques. That’s why we offer optional add-on modules for each of our products.
Particle Analysis Module
A full toolset for identifying and studying particles, pores, grains, islands etc. on textured surfaces.
Fiber Analysis Module
Measure fiber morphology in SEM and light microscopy images
Critical Dimensions & Trenches Module
Evaluate LER and LWR for semiconductor applications
Contour Analysis Module
First level geometric dimensioning & tolerancing of contour profiles & horizontal contours derived from images & surfaces.
Advanced Contour Analysis Module
Extended dimensioning and tolerancing, DXF CAD-compare, Gothic arch and other advanced features.
Advanced Topography Module
Advanced studies, parameters & filters for 3D (“areal”) surface texture analysis
Advanced Profile Module
Advanced profile filtering, Fourier analysis, fractal analysis and statistical analysis of series of profiles
Automotive Module
Assess functional performance with a full set of profile parameters developed by the automotive industry
4D Surface Change Module
Analyse surface change in regards to time, temperature, magnetic field or another dimension.
Thickness Analysis Module
General or zone-specific interactive thickness characterisation based on pairs of surfaces or profiles.
Lens Analysis Module
Analyze and simulate aspheric surfaces and profiles, assessing surface finish in accordance with ISO 10110-8 for imaging systems, sensors, and laser applications.
Scale-sensitive Analysis Module
Multi-scale methods for analysing geometric properties of surfaces and their scale derivatives (formerly Sfrax software).
Fourier & Wavelets Module
FFT-based texture analysis, advanced FFT filtering, multi-scale analysis by wavelets.
Shell Extension Module
Freeform surface management, complex shape analysis, exceptional 3D visualisation.
Shell Topography Module
Metrological analysis of shell data (freeform surfaces).
Shell CAD Compare Module
Quickly and accurately compare measured shell data (actual) with CAD models (nominal) or generated meshes for precise analysis.
Force Curve Analysis Module
Analyze force-distance curves and force volume data to measure adhesion, nanoindentation, and fit WLC models.
IV Spectroscopy Module
Visualize and analyze IV spectroscopy images and individual IV curves, including CITS data.
Correlative Microscopy Module
Process spectral maps, correct and enhance spectral image data and perform correlative analysis
Spectroscopy Module
Visualize, process, analyze and correlate spectroscopic data: IR, Raman, TERS, EDS/EDX, XRF and more
Chemical Cubes Module
Analyze multi-channel compositional data
