Different research and industrial projects require different tools and techniques. That’s why we offer optional add-on modules for each of our products.

Particle Analysis Module
A comprehensive toolset for detecting and analyzing particles, pores, grains, islands etc. on structured surfaces

Fiber Analysis Module
Analyze fiber morphology including diameter & direction in SEM images (SE and BSE modes), light microscopy images and on topographical data.

Critical Dimensions & Trenches Module
Calculate critical dimensions and characterize line edge roughness / line width roughness in semiconductor fabrication processes.

Contour Analysis Module
Basic geometric dimensioning & tolerancing of contour profiles & horizontal contours extracted from images & surfaces

Advanced Contour Analysis Module
Advanced dimensioning and tolerancing, DXF CAD-compare, Gothic arch and other advanced functions

Advanced Topography Module
Advanced studies, parameters & filters for 3D (“areal”) surface texture analysis

Advanced Profile Module
Advanced profile filtering, Fourier analysis, fractal analysis and statistical analysis of series of profiles

Automotive Module
Assess functional performance with a full set of profile parameters developed by the automotive industry

4D Surface Change Module
Analyze surface evolution with respect to time, temperature, magnetic field or another dimension

Thickness Analysis Module
Global or zone-specific interactive thickness characterization based on a pair of surfaces or profiles

Lens Analysis Module
Analyze or simulate aspheric surfaces and profiles and evaluate surface finish according to ISO 10110-8 in imaging systems, sensors and laser applications

Scale-sensitive Analysis Module
Multi-scale methods for analyzing geometric properties of surfaces and their scale derivatives (formerly in Sfrax software)

Fourier & Wavelets Module
FFT-based texture analysis, advanced FFT filtering, multi-scale analysis by wavelets

Shell Extension Module
Freeform surface management, complex shape analysis, high quality 3D visualization

Shell Topography Module
A metrological toolbox for shell data (freeform surfaces)

Shell CAD Compare Module
Efficiently and easily compare measured Shell data (actual) with CAD models (nominal) or generated meshes

Force Curve Analysis Module
Analyze force spectroscopy data: force curves (force-distance curves) and force volume. Measure adhesion events, nanoindentation and fit WLC models.

IV Spectroscopy Module
3D visualization and analysis of IV spectroscopy images and individual IV curve analysis (including CITS data)

Correlative Microscopy Module
Process spectral maps, correct and enhance spectral image data and perform correlative analysis

Spectroscopy Module
Visualize, process, analyze and correlate spectroscopic data: IR, Raman, TERS, EDS/EDX, XRF and more

Chemical Cubes Module
Full visualization & analysis of multi-channel cubes of compositional data