MountainsLab – All-in-One Software for Surface & Image Data

Unify your analysis across all lab instruments

MountainsLab® offers a centralized platform for analyzing data from virtually any type of microscope or profilometer. Whether you’re using optical, SEM, AFM, or spectroscopic techniques, this software suite brings all your results together, offering a consistent and efficient workflow.
Built on the trusted Mountains® technology, MountainsLab® is the go-to solution for labs handling diverse instrument outputs. Rely on decades of experience and continuous innovation to streamline your analytical processes.

30-day free trial

Test-drive the latest version of Mountains® 10 – no strings attached.

Unified Data Hub >>>

  • Combine results from profilometers, microscopes, and spectroscopy systems
  • Load and process files created by any Mountains® user
  • Handle hundreds of native and standard formats

Works with All Major Instruments >>>

  • Analyze data from a wide range of devices including profilometers, optical microscopes, SEM, SPM/AFM, and spectroscopy systems
  • Open and process data in hundreds of supported file formats from leading instrument manufacturers

Correlative analysis >>>

  • Perform correlative analysis
  • Use the  colocalization feature to combine and overlay data from different instruments
  • Access advanced rendering options

Surface texture analysis >>>

  • Full suite of form and roughness evaluation tools
  • Benefit from advanced filtering and robust parameters based on international standards

Advanced particle & fiber tools>>>

  • Detect, classify, and measure particles, pores, or fibers
  • Apply segmentation tailored to your application
  • Visualize and report with automatic stats and charts

Powerful Statistical Tools >>>

  • Monitor static or dynamic data populations
  • Automatically update charts like histograms, scatter plots, and control charts

Precision Contour Analysis >>>

  • Measure profiles and compare with CAD references
  • Visualize form deviations for quality assurance

Force Curve & Volume Data Analysis >>>

  • Explore force-distance curves
  • Detect adhesion points, model with WLC (Wormlike Chain), generate Young’s Modulus maps

Spectroscopy Data Integration >>>

  • Analyze spectra, spectral maps, and hyperspectral datasets
  • Work with Raman, IR, EDS, cathodoluminescence, XPS, and more
  • Load and process multi-channel data cubes

SEM image colorization >>>

  • Instantly colorize SEM images using automated detection

3D SEM tools >>>

  • Reconstruct 3D topography from stereo pairs or quadrant detector scans

Learning & Teaching Tools >>>

  • Access tutorials and ready-made templates tailored to different instruments
  • Standardize training and onboard new users with ease

Mountains® core features

Choose the right MountainsLab® product for you

KEY FEATURES MountainsLab® Premium MountainsLab® Expert
Instrument compatibility
All types of surface measuring and imaging instrument: 2D/3D profilometer, light microscope, scanning electron microscopes, scanning probe microscopes, spectrometer etc.
Roughness and waviness analysis on profiles and surfaces
SEM image colorization & 3D reconstruction from stereo or quad SEM images
Correction tools, parameters and filters for SPM image analysis
Spectral map processing & spectral image correction & enhancement
Correction measurement & filtering tools for images from light microscopy & other techniques
Statistical analysis of static and dynamic populations
OPTIONAL MODULES MountainsLab® Premium MountainsLab® Expert
Advanced profile analysis
Automotive profile parameters
Advanced topography analysis
Particle analysis
Correlative analysis
Spectroscopy
Contour analysis

Option

Advanced contour analysis including CAD compare

Option

Fourier & wavelets analysis

Option

Fiber analysis of images & topography

Option

Lens analysis

Option

Force curve and force volume analysis

Option

IV Spectroscopy

Option

Thickness analysis

Option

4D surface change analysis

Option

Chemical cubes

Option

Support for Shells (freeform surfaces)

Option

Shell Topography for metrological analysis

Option

Shell CAD compare

Option

Option

Scale-sensitive fractal analysis

Option

Option

Lead analysis (Twist)

Option

Option

Critical Dimensions & Trenches

Option

Option

Optional modules

Besides the analysis capabilities in the core version of MountainsMap® are a variety of optional modules that allow the user to extend the analysis capability of the software for advanced and specialised applications.

Shell Extension Module

Freeform surface management, complex shape analysis, exceptional 3D visualisation.

Shell Topography Module

Metrological analysis of shell data (freeform surfaces).

IV Spectroscopy Module

Visualize and analyze IV spectroscopy images and individual IV curves, including CITS data.

Chemical Cubes Module

Analyze multi-channel compositional data

Scale-sensitive Analysis Module

Multi-scale methods for analysing geometric properties of surfaces and their scale derivatives (formerly Sfrax software).

Force Curve Analysis Module

Analyze force-distance curves and force volume data to measure adhesion, nanoindentation, and fit WLC models.

Lead Analysis (Twist) Module

2nd generation lead (twist) analysis for the automotive industry.

Contour Analysis Module

First level geometric dimensioning & tolerancing of contour profiles & horizontal contours derived from images & surfaces.

Advanced Contour Analysis Module

Extended dimensioning and tolerancing, DXF CAD-compare, Gothic arch and other advanced features.

4D Surface Change Module

Analyse surface change in regards to time, temperature, magnetic field or another dimension.

Fourier & Wavelets Module

FFT-based texture analysis, advanced FFT filtering, multi-scale analysis by wavelets.

Thickness Analysis Module

General or zone-specific interactive thickness characterisation based on pairs of surfaces or profiles.

Fiber Analysis Module

Measure fiber morphology in SEM and light microscopy images

Lens Analysis Module

Analyze and simulate aspheric surfaces and profiles, assessing surface finish in accordance with ISO 10110-8 for imaging systems, sensors, and laser applications.

Shell CAD Compare Module

Quickly and accurately compare measured shell data (actual) with CAD models (nominal) or generated meshes for precise analysis.

Critical Dimensions & Trenches Module

Evaluate LER and LWR for semiconductor applications