MountainsLab – Multi-instrument

One analysis software solution for all your instrument data

Looking for a comprehensive software suite that can handle all your microscope and profiler data? Look no further than MountainsLab®. Our industry-standard surface analysis solution is the ideal choice for labs of all types, providing a centralized hub for all your instrument data. With our team’s extensive expertise and support, you can trust that your analysis will be successful no matter your application.
The most comprehensive set of form and surface texture analyses – Particle and pore analysis – Fiber analysis – Statistical analysis of static and dynamic populations – Force curve and force volume analysis – Features for spectroscopy (Raman, IR, EDS/EDX, cathodoluminescence etc.) – Color and topography innovation for scanning electron microscopy – Analysis of multi-channel cubes of compositional data – And much more

30-day free trial

Try Mountains®10 software for free

Data confluence >>>

  • Bring together data from multiple instruments (profilometer, microscope)
  • Speed up analysis
  • Load any document created by other Mountains® users
  • Process data from virtually any type of surface and image analysis instrument

Compatible with any instrument >>>

  • Process data from profilometers, light microscopes, scanning electron microscopes (SEM), scanning probe microscopes (SPM) and spectroscopic techniques
  • Load hundreds of file formats

Correlative analysis >>>

  • Perform correlative analysis
  • Use the  colocalization feature to combine and overlay data from different instruments
  • Access advanced rendering options

Surface texture analysis >>>

  • Benefit from Digital Surf’s expertise in surface metrology
  • Analyze surface texture
  • Access advanced filters and parameters

Advanced particle & fiber analysis >>>

  • Detect and quantify particles and fibers on any surface
  • Benefit from application-oriented segmentation techniques
  • Group particles into classes based on characteristics
  • Generate statistics and graphics

Generate statistics >>>

  • Generate statistics for static or dynamic data populations
  • Create statistics reports and let MountainsLab® detect and update data automatically
  • Graphically display data by using control charts, histograms, scatter plots and more

Advanced contour analysis >>>

  • Automatically generate dimensions of profiles
  • Compare profiles with CAD data or nominal form
  • Graphically display form deviations

Force spectroscopy >>>

  • Analyze force curves and force volume
  • Detect adhesion force, apply Wormlike chain (WLC) models for protein unfolding, generate Young’s Modulus map etc.

Data processing for spectroscopic techniques >>>

  • Visualize and analyze spectra, spectral maps and hyperspectral images
  • Correlate data from spectroscopy with data and images from other instruments
  • Load multi-channel cubes of compositional data

SEM image colorization >>>

  • Add color to objects in SEM images in just a few clicks
  • Automatic object detection
  • Save time compared with using photo editing software

3D SEM image reconstruction >>>

  • Generate 3D surface topography from two successive tilted scans of your sample or 4 images scanned by a 4-quadrant detector, all in a matter of seconds

Learn & teach >>>

  • Access tutorials and ready-to-use templates adapted to each different instrument type
  • Teach new colleagues about surface and image analysis routines using templates

Mountains® core features

Select your product

KEY FEATURES MountainsLab® Premium MountainsLab® Expert
Instrument compatibility
All types of surface measuring and imaging instrument: 2D/3D profilometer, light microscope, scanning electron microscopes, scanning probe microscopes, spectrometer etc.
Roughness and waviness analysis on profiles and surfaces
SEM image colorization & 3D reconstruction from stereo or quad SEM images
Correction tools, parameters and filters for SPM image analysis
Spectral map processing & spectral image correction & enhancement
Correction measurement & filtering tools for images from light microscopy & other techniques
Statistical analysis of static and dynamic populations
OPTIONAL MODULES MountainsLab® Premium MountainsLab® Expert
Advanced profile analysis
Automotive profile parameters
Advanced topography analysis
Particle analysis
Correlative analysis
Spectroscopy
Contour analysis

Option

Advanced contour analysis including CAD compare

Option

Fourier & wavelets analysis

Option

Fiber analysis of images & topography

Option

Lens analysis

Option

Force curve and force volume analysis

Option

IV Spectroscopy

Option

Thickness analysis

Option

4D surface change analysis

Option

Chemical cubes

Option

Support for Shells (freeform surfaces)

Option

Shell Topography for metrological analysis

Option

Shell CAD compare

Option

Option

Scale-sensitive fractal analysis

Option

Option

Lead analysis (Twist)

Option

Option

Critical Dimensions & Trenches

Option

Option

Recommended optional modules

The following range of optional modules for advanced and specialized applications is available for MountainsLab®.

Shell Extension Module

Freeform surface management, complex shape analysis, high quality 3D visualization

Shell Topography Module

A metrological toolbox for shell data (freeform surfaces)

IV Spectroscopy Module

3D visualization and analysis of IV spectroscopy images and individual IV curve analysis (including CITS data)

Chemical Cubes Module

Full visualization & analysis of multi-channel cubes of compositional data

Scale-sensitive Analysis Module

Multi-scale methods for analyzing geometric properties of surfaces and their scale derivatives (formerly in Sfrax software)

Force Curve Analysis Module

Analyze force spectroscopy data: force curves (force-distance curves) and force volume. Measure adhesion events, nanoindentation and fit WLC models.

Lead Analysis (Twist) Module

2nd generation lead (twist) analysis for the automotive industry

Contour Analysis Module

Basic geometric dimensioning & tolerancing of contour profiles & horizontal contours extracted from images & surfaces

Advanced Contour Analysis Module

Advanced dimensioning and tolerancing, DXF CAD-compare, Gothic arch and other advanced functions

4D Surface Change Module

Analyze surface evolution with respect to time, temperature, magnetic field or another dimension

Fourier & Wavelets Module

FFT-based texture analysis, advanced FFT filtering, multi-scale analysis by wavelets

Thickness Analysis Module

Global or zone-specific interactive thickness characterization based on a pair of surfaces or profiles

Fiber Analysis Module

Analyze fiber morphology including diameter & direction in SEM images (SE and BSE modes), light microscopy images and on topographical data.

Lens Analysis Module

Analyze or simulate aspheric surfaces and profiles and evaluate surface finish according to ISO 10110-8 in imaging systems, sensors and laser applications

Shell CAD Compare Module

Efficiently and easily compare measured Shell data (actual) with CAD models (nominal) or generated meshes

Critical Dimensions & Trenches Module

Calculate critical dimensions and characterize line edge roughness / line width roughness in semiconductor fabrication processes.