MountainsSPIP – Scanning Probe Microscopy

AFM & SPM analysis software from the experts

Based on industry-standard Mountains® technology and now also including all the best SPIP™ (Image Metrology) interactivity and analytical tools, MountainsSPIP® software contains the most advanced set of professional tools on the market for your scanning probe microscopy image analysis.
Apply interactive particle analysis – Analyze force curves and force volume images – Perform correlative analysis by combining SPM images and data from other instruments – Analyze multi-channel files – Process data from ANY scanning probe microscope including atomic force microscopes (AFM) – Correct, normalize and denoise measured data – Ensure correct XY calibration – Correct tip effect – Characterize surface texture in accordance with ISO standards

30-day free trial

Try Mountains®10 software for free

Advanced particle analysis >>>

  • Easily detect and quantify features of any shape and size
  • Quantify 70+ characteristics (height, area, volume, perimeter etc.) for the whole sample or individual particles
  • Create classifications and generate statistics on one or several populations

Force spectroscopy >>>

  • View, process and analyze force curves and force volume images
  • Correct data, create interactive parameter maps and manage large collections of curves
  • Calculate adhesion, Young’s modulus, energies, stiffness, WLC etc.

Correlative analysis >>>

  • Combine SPM images with data from other instruments (SEMs, 3D optical microscopes, confocal microscopes etc.) to perform correlative analysis
  • Colocalize with chemical composition data

Multi-channel imaging & analysis >>>

  • Handle multi-channel files
  • Visualize different channels in 3D
  • Apply analysis to a single layer or to all layers
  • Extract multi-layer cross-sections

Automate SPM image analysis >>>

  • Make SPM image analysis faster and more efficient
  • Analyze large batches of data automatically
  • Save your progress and resume your work where you left off
  • Access powerful statistical tools

Data correction & normalization >>>

  • Get your data ready for analysis with correction, normalization & denoising tools
  • Remove anomalous scan lines and isolated artifacts
  • Use FFT-based filtering and thresholding

Lattice & lateral calibration >>>

  • Automatically determine a lattice by detecting a unit cell
  • Calculate correction parameters then apply them to measured data
  • Adjust unit cell detection based on FFT analysis

Tip deconvolution >>>

  • Correct image distortion due to tip convolution
  • Simulate or reconstruct tip geometry and re-use it for the deconvolution of other measured data

Surface texture analysis >>>

  • Characterize surface texture in accordance with international standards
  • Apply advanced ISO 16610 filtering techniques and ISO 25178 3D parameters

Mountains® core features

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KEY FEATURES MountainsSPIP® Premium MountainsSPIP® Expert MountainsSPIP® Starter
Instrument compatibility
Any scanning probe microscope (SPM) including atomic force microscopy (AFM), STM, SNOM etc.
3D views with animation
Advanced File Explorer
Automation (template documents and document save/load features)
Basic correction tools (level, correct lines etc.)
Essential 2D & 3D parameters and filters
Dimensional measurements (step heights, distances etc.)
Full reporting facilities including PDF and Word export
Full set of statistical tools

Not compatible

Tip deconvolution

Not compatible

Image stitching

Not compatible

OPTIONAL MODULES MountainsSPIP® Premium MountainsSPIP® Expert MountainsSPIP® Starter
Detection, analysis and classification of particles and pores

Option

Correlative microscopy

Option

Option

IV Spectroscopy

Option

Not compatible

Force curve analysis

Option

Option

Critical Dimensions & Trenches

Option

Option

Not compatible

Contour Analysis

Option

Not compatible

Not compatible

Advanced Contour Analysis

Option

Not compatible

Not compatible

Fiber Analysis

Option

Option

Not compatible

Scale-sensitive Fractal Analysis

Option

Not compatible

Not compatible

Spectroscopy

Option

Option

Not compatible

4D Surface Change

Option

Option

Not compatible

Recommended optional modules

The following range of optional modules for advanced and specialized applications is available for MountainsSPIP® range.

Force Curve Analysis Module

Analyze force spectroscopy data: force curves (force-distance curves) and force volume. Measure adhesion events, nanoindentation and fit WLC models.

Particle Analysis Module

A comprehensive toolset for detecting and analyzing particles, pores, grains, islands etc. on structured surfaces

IV Spectroscopy Module

3D visualization and analysis of IV spectroscopy images and individual IV curve analysis (including CITS data)

Spectroscopy Module

Visualize, process, analyze and correlate spectroscopic data: IR, Raman, TERS, EDS/EDX, XRF and more

Critical Dimensions & Trenches Module

Calculate critical dimensions and characterize line edge roughness / line width roughness in semiconductor fabrication processes.

Contour Analysis Module

Basic geometric dimensioning & tolerancing of contour profiles & horizontal contours extracted from images & surfaces

Advanced Contour Analysis Module

Advanced dimensioning and tolerancing, DXF CAD-compare, Gothic arch and other advanced functions

4D Surface Change Module

Analyze surface evolution with respect to time, temperature, magnetic field or another dimension

Correlative Microscopy Module

Process spectral maps, correct and enhance spectral image data and perform correlative analysis

Fiber Analysis Module

Analyze fiber morphology including diameter & direction in SEM images (SE and BSE modes), light microscopy images and on topographical data.

Scale-sensitive Analysis Module

Multi-scale methods for analyzing geometric properties of surfaces and their scale derivatives (formerly in Sfrax software)