MountainsSPIP – Advanced image analysis for Scanning Probe Microscopy

by ImageScience Admin

Powerful SPM & AFM data processing software

MountainsSPIP® brings together the best of Mountains® technology and SPIP™ (Image Metrology) tools, delivering an advanced solution for scanning probe microscopy (SPM) image analysis. It is designed to handle data from any scanning probe microscopes, including atomic force microscopes (AFM), providing users with a comprehensive suite of interactive tools for particle analysis, force spectroscopy, multi-channel imaging, and more.

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Advanced particle analysis >>>

  • Detect and quantify particles of any shape and size with ease.
  • Extract over 70 parameters (height, area, volume, perimeter, etc.) for individual particles or entire datasets.
  • Classify and compare multiple populations with detailed statistical tools.

Force Spectroscopy & Force Volume Analysis >>>

  • Visualize, process, and analyze force curves and force volume images.
  • Apply corrections, generate interactive parameter maps, and efficiently handle large datasets.
  • Compute adhesion, Young’s modulus, stiffness, energy dissipation, worm-like chain models (WLC), and more.

Correlative & Multi-Modal Analysis >>>

  • Integrate SPM images with data from other instruments, including SEMs, 3D optical microscopes, and confocal microscopes.
  • Perform colocalization with chemical composition maps.
  • Enhance your analysis with multi-modal data fusion.

Multi-Channel Imaging & Layer Analysis >>>

  • Process and analyze multi-channel data files from scanning probe instruments.
  • Visualize individual channels in 3D for in-depth interpretation.
  • Apply analysis techniques to specific layers or all layers simultaneously.
  • Extract cross-sections from multi-layer datasets.

Automated SPM Image Processing >>>

  • Speed up SPM image analysis with automation tools.
  • Process large datasets efficiently by applying saved workflows.
  • Resume analysis exactly where you left off.
  • Utilize powerful statistical analysis tools to extract insights.

Data Correction & Preprocessing >>>

  • Prepare your data for analysis with advanced correction, normalization, and denoising tools.
  • Remove scan line artifacts and isolated anomalies automatically.
  • Apply FFT-based filtering and thresholding for enhanced data clarity.

Lattice & Lateral Calibration >>>

  • Detect unit cells automatically and determine lattice structures with precision.
  • Calculate and apply correction parameters to measured data.
  • Adjust FFT-based unit cell detection for improved accuracy.

Tip Deconvolution & Correction >>>

  • Reduce image distortion caused by tip convolution effects.
  • Simulate and reconstruct tip geometry, then reuse it for deconvolution of other datasets.

Surface Texture Analysis >>>

  • Characterize surfaces following international metrology standards.
  • Apply ISO 16610 filtering techniques for advanced surface texture evaluation.
  • Compute ISO 25178 3D parameters for in-depth roughness and waviness assessment.

Why Choose MountainsSPIP®?

Total Traceability & Interactive Workflow

Keep track of all analysis steps applied to your data.
Undo or modify any step at any time.
Work in an interactive, document-based environment for structured analysis.

Powerful Automation for Increased Efficiency

Automate repetitive tasks with user-friendly no-code tools.
Save and reuse analysis sequences for batch processing of large datasets.
Pick up where you left off.

Scientific Software with a Customizable Layout

Organize analysis steps across multiple pages.
Export results in PDF, Word, or Excel formats to share with colleagues, students, or clients.

Universal Compatibility – Works with All SPMs

Compatible with all brands and types of scanning probe microscopes.
Used by tens of thousands of researchers, scientists, and engineers worldwide.
Trusted by leading microscope manufacturers and national research institutions (NIST, NPL, PTB, LNE, etc.).

Multi-Language Support & Global Assistance

Work in 11 supported languages for seamless user experience.
Get expert guidance from our international support team, specialized in SPM applications.

Choose the right MountainsSPIP® product

KEY FEATURES MountainsSPIP® Premium MountainsSPIP® Expert MountainsSPIP® Starter
Instrument compatibility
Any scanning probe microscope (SPM) including atomic force microscopy (AFM), STM, SNOM etc.
3D views with animation
Advanced File Explorer
Automation (template documents and document save/load features)
Basic correction tools (level, correct lines etc.)
Essential 2D & 3D parameters and filters
Dimensional measurements (step heights, distances etc.)
Full reporting facilities including PDF and Word export
Full set of statistical tools

Not compatible

Tip deconvolution

Not compatible

Image stitching

Not compatible

OPTIONAL MODULES MountainsSPIP® Premium MountainsSPIP® Expert MountainsSPIP® Starter
Detection, analysis and classification of particles and pores

Option

Correlative microscopy

Option

Option

IV Spectroscopy

Option

Not compatible

Force curve analysis

Option

Option

Critical Dimensions & Trenches

Option

Option

Not compatible

Contour Analysis

Option

Not compatible

Not compatible

Advanced Contour Analysis

Option

Not compatible

Not compatible

Fiber Analysis

Option

Option

Not compatible

Scale-sensitive Fractal Analysis

Option

Not compatible

Not compatible

Spectroscopy

Option

Option

Not compatible

4D Surface Change

Option

Option

Not compatible

Recommended optional modules

The following range of optional modules for advanced and specialized applications is available for MountainsSPIP® range.

Force Curve Analysis Module

Analyze force-distance curves and force volume data to measure adhesion, nanoindentation, and fit WLC models.

Read more

Particle Analysis Module

Detect and quantify particles, pores, grains, and islands on structured surfaces with advanced classification tools.

Read more

IV Spectroscopy Module

Visualize and analyze IV spectroscopy images and individual IV curves, including CITS data.

Read more

Spectroscopy Module

Process and analyze spectroscopic data from IR, Raman, TERS, EDS/EDX, XRF, and more.

Read more

Critical Dimensions & Trenches Module

Measure critical dimensions, line edge roughness, and line width roughness for semiconductor fabrication.

Read more

Contour Analysis Module

Perform basic GD&T on contour profiles and horizontal cross-sections from images and surface data.

Read more

Advanced Contour Analysis Module

Conduct CAD model comparison, Gothic arch analysis, and advanced profile dimensioning.

Read more

4D Surface Change Module

Track surface changes over time or under varying conditions like temperature or magnetic fields.

Read more

Correlative Microscopy Module

Enhance spectral maps, process spectral image data, and perform multi-modal analysis.

Read more

Fiber Analysis Module

Analyze fiber morphology, measuring diameter and orientation in microscopy and topographical data.

Read more

Scale-sensitive Analysis Module

Apply multi-scale methods to assess surface geometry and scale-dependent properties.

Read more