MountainsSEM – Advanced SEM image analysis software

by ImageScience Admin

Unlock the full potential of your scanning electron microscope

MountainsSEM® software is a powerful and trusted solution designed for in-depth analysis of SEM images. Leading SEM manufacturers worldwide rely on its advanced features to enhance and interpret electron microscopy data with precision.

30-day free trial

Discover how MountainsSEM® can transform your SEM image analysis. Request a 30-day free trial and experience the full potential of cutting-edge electron microscopy software.

Free Trial

Enhance & colorize SEM images >>>

  • Instantly apply colors to SEM images with the “Click and Color” tool.
  • Improve image quality with advanced correction and enhancement features

3D surface reconstruction >>>

  • Generate high-precision 3D topography from two SEM images captured at different tilt angles.
  • Get accurate height values and calculate surface roughness.

3D reconstruction from 4-quadrant images >>>

Create 3D surface models from 4 images acquired using a four-quadrant detector.

Line edge & width roughness analysis >>>

Precisely assess edge and width roughness parameters in micro- and nanostructures.

3D chemical mapping >>>

Generate visually striking 3D overlays of EDS/EDX spectral data on reconstructed SEM topographies.

Volume electron microscopy exploration >>>

Visualize and analyze volumetric SEM datasets, including FIB-SEM and serial block-face SEM

2D structure analysis >>>

Use robust particle analysis tools on your SEM images and automatically detect and analyze features using SEM-dedicated structure recognition.

Fiber Analysis >>>

Identify, measure, and classify fibers using dedicated SEM algorithms, even in overlapping structures.

Correlative microscopy >>>

Combine SEM imagery with data from complementary techniques, such as AFM, EDS, or Raman spectroscopy, for enhanced insights.

Why choose MountainsSEM®?

Compatible with any SEM

Works with all major SEM brands and is widely used by leading instrument manufacturers.
Trusted by top research institutions worldwide (NIST, NPL, PTB, LNE, etc.).

Scientific software with full traceability

Maintain an interactive workflow with complete analysis history.
Undo or modify any analysis step at any time.
Publish results in PDF, Word, or Excel for seamless reporting.

Automation & advanced analysis

Automate repetitive workflows with no-code tools.
Apply analysis sequences to large datasets.
Accelerate processing with built-in statistical tools.

Global support & multilingual interface

Work in 11 different languages.
Access expert support tailored to SEM applications.

Choose the right MountainsSEM® package

KEY FEATURES MountainsSEM® Premium MountainsSEM® Expert MountainsSEM® Color
Instrument compatibility
Any scanning electron microscope (SEM)
Quick SEM image colorization
Basic analysis and measurement tools
Image correction & enhancement tools
Ultra-fast 3D reconstruction from 2 or 4 SEM images

Not compatible

Instant 3D enhancement of single SEM images

Not compatible

EDS/EDX map overlays on surface topography

Not compatible

OPTIONAL MODULES MountainsSEM® Premium MountainsSEM® Expert MountainsSEM® Color
Correlative Microscopy

Not compatible

2D particle analysis & characterization

Option

Option

Fiber Analysis

Option

Option

Volume electron microscopy cube visualization & analysis

Option

Not compatible

Contour analysis

Option

Option

Support for Shells (freeform surfaces)

Option

Not compatible

Critical Dimensions & Trenches

Option

Option

Option

Advanced profile analysis

Option

Option

Not compatible

Advanced Topography Analysis

Option

Not compatible

Not compatible

Fourier & wavelets analysis

Option

Option

Not compatible

Spectroscopy

Option

Option

Not compatible

Thickness Analysis

Option

Option

Not compatible

4D Surface Change

Option

Option

Not compatible

Optional advanced modules

Enhance your MountainsSEM® experience with specialized analysis modules

Chemical Cubes Module

Analyze multi-channel compositional data

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Fiber Analysis Module

Measure fiber morphology in SEM and light microscopy images

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Critical Dimensions & Trenches Module

Evaluate LER and LWR for semiconductor applications

Read more

Shell Extension Module

Advanced 3D visualization of freeform surfaces

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Spectroscopy Module

Process IR, Raman, TERS, EDS/EDX, XRF, and more

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Contour Analysis Module

Perform GD&T evaluations on profiles

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Particle Analysis Module

A comprehensive toolset for detecting and analyzing particles, pores, grains, islands etc. on structured surfaces

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Advanced Topography Module

Apply specialized 3D surface texture parameters

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Thickness Analysis Module

Characterize thickness variations interactively.

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Advanced Profile Module

Extended 2D profile filtering, Fourier analysis, fractal analysis and statistical analysis of series of profiles

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Fourier & Wavelets Module

Conduct advanced FFT and wavelet-based texture analysis

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4D Surface Change Module

Study surface evolution over time or under varying conditions

Read more