MountainsSEM – Scanning Electron Microscopy

by ImageScience Admin

SEM image analysis software you can rely on

Trusted by the world’s greatest SEM manufacturers, MountainsSEM® software is a comprehensive, dedicated solution for your scanning electron microscope image analysis.
Add color to objects in SEM images in just a few clicks – Reconstruct the 3D topography of your sample from one or multiple image scans – Calculate line edge roughness (LER) – Create 3D effects with EDS/EDX maps – Visualize & analyze volume electron microscopy cubes (FIB-SEM, serial block-face SEM, array tomography etc.) – Perform 2D particle analysis & fiber analysis – Measure objects in SEM images (lengths, areas, angles, volumes etc.) – Combine SEM images with data from other instruments for correlative study – Stitch images for large specimens – Correct and enhance SEM images – Characterize surface roughness

30-day free trial

Try Mountains®10 software for free

Free Trial

SEM image colorization & enhancement >>>

  • “Click and color” tool for colorizing SEM images quickly and easily
  • Apply image correction and enhancement tools

3D reconstruction from stereo pairs >>>

  • Reconstruct 3D surface topography from two successive tilted scans of your sample in just a few seconds and obtain accurate height values.
  • Obtain accurate height values and evaluate surface roughness.

3D reconstruction from 4 images >>>

Reconstruct 3D surface topography from 4 images obtained using a four-quadrant detector.

Line edge roughness >>>

Calculate line edge roughness (LER) and line width roughness (LWR) parameters on the edges of bands detected in SEM images

Create 3D chemical maps with EDS data >>>

Build spectacular 3D renderings associating EDS (EDX) maps or other spectral/compositional data with topography reconstructed from SEM images

Volume electron microscopy analysis >>>

  • Load, display and analyze volume electron microscopy image series (FIB-SEM, serial block-face SEM, array tomography etc.) as cubes
  • Associate tomography and chemical analysis

2D particle analysis >>>

Apply powerful particle analysis tools to your SEM data and automatically identify and quantify features in your image using SEM-specific object recognition.

Fiber Analysis >>>

  • Quantify interstices & individual fibers, even if they overlap
  • Calculate diameter & orientation of fibers
  • Use SEM-dedicated fiber detection algorithms

Correlative analysis >>>

  • Combine SEM images from different detectors or with data from other measurement instruments such as AFM or EDS (EDX)
  • Colocalize your SEM images with spectral analysis data

Mountains® core features

Works with all SEMs, trusted by the manufacturers

Process data from any brand of SEM
Join over 22,000+ Mountains® users worldwide
Use image analysis software chosen & provided by the leading SEM manufacturersThe majority of national research laboratories trust the precision of Mountains® (NIST, NPL, PTB, LNE etc.)

Scientific software with a document layout

Organize the different steps of your SEM image processing (original images, distance measurements, particle statistics etc.) on one or several pages
Publish these directly in different formats (PDF, Word and Excel) to share with colleagues, students, clients etc.

Total traceability

MountainsSEM® unique analysis workflow lets users see all the analysis steps already applied to data
Revert back to any step in the process at any time
Workflow is interactive

Powerful automation

Automate your repetitive SEM work and speed up your analysis process with no-code tools
Save analysis sequences and reapply automatically to large batches of data
Accelerate analysis with built-in statistics tools

Surface imaging & metrology expertise

30+ years’ experience developing analysis software for the global industrial and scientific community
Heavy investment in research and development
Our team of experts constantly test and improve the quality of Mountains® and ensure the software is compliant with current scientific norms and methods

Work & get help in your own language

Work in one of the 11 languages available in the MountainsSEM® user interface
Get help on using the software for your SEM applications from our international support team

Select your product

KEY FEATURES MountainsSEM® Premium MountainsSEM® Expert MountainsSEM® Color
Instrument compatibility
Any scanning electron microscope (SEM)
Quick SEM image colorization
Basic analysis and measurement tools
Image correction & enhancement tools
Ultra-fast 3D reconstruction from 2 or 4 SEM images

Not compatible

Instant 3D enhancement of single SEM images

Not compatible

EDS/EDX map overlays on surface topography

Not compatible

OPTIONAL MODULES MountainsSEM® Premium MountainsSEM® Expert MountainsSEM® Color
Correlative Microscopy

Not compatible

2D particle analysis & characterization

Option

Option

Fiber Analysis

Option

Option

Volume electron microscopy cube visualization & analysis

Option

Not compatible

Contour analysis

Option

Option

Support for Shells (freeform surfaces)

Option

Not compatible

Critical Dimensions & Trenches

Option

Option

Option

Advanced profile analysis

Option

Option

Not compatible

Advanced Topography Analysis

Option

Not compatible

Not compatible

Fourier & wavelets analysis

Option

Option

Not compatible

Spectroscopy

Option

Option

Not compatible

Thickness Analysis

Option

Option

Not compatible

4D Surface Change

Option

Option

Not compatible

Recommended optional modules

The following range of optional modules for advanced and specialized applications is available for MountainsSEM®.

Chemical Cubes Module

Full visualization & analysis of multi-channel cubes of compositional data

Read more

Fiber Analysis Module

Analyze fiber morphology including diameter & direction in SEM images (SE and BSE modes), light microscopy images and on topographical data.

Read more

Critical Dimensions & Trenches Module

Calculate critical dimensions and characterize line edge roughness / line width roughness in semiconductor fabrication processes.

Read more

Shell Extension Module

Freeform surface management, complex shape analysis, high quality 3D visualization

Read more

Spectroscopy Module

Visualize, process, analyze and correlate spectroscopic data: IR, Raman, TERS, EDS/EDX, XRF and more

Read more

Contour Analysis Module

Basic geometric dimensioning & tolerancing of contour profiles & horizontal contours extracted from images & surfaces

Read more

Particle Analysis Module

A comprehensive toolset for detecting and analyzing particles, pores, grains, islands etc. on structured surfaces

Read more

Advanced Topography Module

Advanced studies, parameters & filters for 3D (“areal”) surface texture analysis

Read more

Thickness Analysis Module

Global or zone-specific interactive thickness characterization based on a pair of surfaces or profiles

Read more

Advanced Profile Module

Advanced profile filtering, Fourier analysis, fractal analysis and statistical analysis of series of profiles

Read more

Fourier & Wavelets Module

FFT-based texture analysis, advanced FFT filtering, multi-scale analysis by wavelets

Read more

4D Surface Change Module

Analyze surface evolution with respect to time, temperature, magnetic field or another dimension

Read more