A unique analytical combination of field-free UHR SEM with Plasma FIB with unmatched precision and speed for the most comprehensive multimodal materials characterization and automated TEM sample preparation
The TESCAN AMBER X 2, powered by Mistral™ Plasma FIB and the third-generation BrightBeam™ Field-Free UHR SEM, excels in precise TEM sample preparation with 500 eV final polishing and fully automated TEM sample preparation through TEM AutoPrep™ software. The AI-driven TEM AutoPrep™ software simplifies the TEM sample preparation process, making it accessible for both new users and those accustomed to working with Ga FIB-SEMs. At the same time, the AMBER X 2 features excellent beam parameters across all beam currents for fast, high-quality 3D analysis of your materials. The third-generation BrightBeam™ Field-Free UHR SEM column acquires multiple electron signals, including energy filtering, and is ideal for analyzing ferromagnetic materials, magnetic powders, and non-conductive samples. This versatile platform ensures precise, efficient, and automated TEM lamella preparation, while maintaining high throughput for 3D characterization, enhancing both productivity and versatility in your lab.
Plasma FIB-SEM, Redefined
TESCAN AMBER X 2 combines pristine FIB resolution, excellent ion beam parameters and a field-free SEM column to redefine speed, accuracy and utility in sample preparation and characterization.
Meet AMBER X 2, Our Most Advanced Plasma FIB-SEM
When it comes to plasma FIB-SEM, TESCAN AMBER X 2 is as state-of-the-art as it gets. A holistic solution for materials science research, it prepares high-quality TEM samples, analyzes the structure and chemistry of materials in both 2D and 3D, and provides correlative multimodal analytical information with unmatched speed and precision.
With its unique field-free SEM column and the latest Mistral™ Plasma FIB column, AMBER X 2 stands out as the most adaptable, flexible, and user-friendly plasma FIB-SEM on the market.
Key benefits of TESCAN AMBER X 2
Comprehensive 3D Analysis with Multimodal Tomography
Analyze and interpret your sample structure, elemental distribution and chemistry, including isotopic characterization, in 3D by employing TESCAN’s unique Multimodal 3D FIB-SEM Tomography, which enables acquisition of EDS, EBSD and TOF-SIMS data during FIB serial cross-sectioning
Fast, Precise 3D Characterization with Mistral™ Plasma FIB
Characterize any sample in 3D quickly and obtain the cleanest surface at your areas of interest by utilizing high beam currents of Xe ion beam and the precision delivered by the market leading beam parameters of the Mistral™ Plasma FIB column
High-Resolution TEM Sample Prep with Plasma FIB
Prepare TEM samples with plasma FIB just as you would with Ga FIB, without any Ga metal intercalation, by taking advantage of the unmatched FIB resolution and beam density of the new Mistral™ Plasma FIB column, and fully automated TEM sample prep—TEM AutoPrep™
Rapid Data from Challenging Samples with Rocking Stage
Obtain the best data even faster from challenging samples such as SiC, ceramics, graphite anodes and more by utilizing TESCAN’s proprietary Rocking Stage and the highest beam current of the Mistral™ Plasma FIB column to produce pristine surfaces
Ultra-High Resolution Imaging with BrightBeam™ UHR-SEM
Perform ultra-high resolution imaging and surface sensitive nanoanalysis on the widest range of materials, with the BrightBeam™ field-free UHR-SEM column, which features low landing energies for sensitive materials
Fast 3D Characterization with Superior Surface Quality
Speed 3D characterization or cross-sectioning of large areas and assure superior surface quality with TESCAN Rocking Stage to suppress curtaining artifacts and TESCAN TRUE-X-Sectioning for large volume material studies up to 1 mm