TESCAN MIRA XR: Ultra-High-Resolution SEM-EDS for Materials Science
Accelerate your materials analysis with precision, speed, and ease.
The TESCAN MIRA XR is a next-generation ultra-high-resolution SEM-EDS solution, designed specifically for academic and quality control environments. With streamlined workflows, intuitive software, and breakthrough imaging performance, it delivers fast, accurate results across a wide variety of materials.
Performance Meets Productivity
The MIRA XR is engineered for high-throughput, multi-user labs, enabling rapid time-to-data and efficient analysis through:
- Ultra-High-Resolution Field Emission Gun (FEG)
- In-Flight™ Automated Controls for seamless transitions between imaging and analytical modes
- Dual Essence™ EDS Integration for twice-as-fast compositional mapping
- Wide Field Optics™ for fast navigation and large-area observation
Whether you’re identifying failure points or exploring fine surface structures, MIRA XR ensures optimal contrast and resolution with every scan.
Key Advantages pf TESCAN MIRA XR
Boost Throughput by 40%
Thanks to automated beam adjustments and ultra-fast imaging, your lab can achieve more in less time.
Smart Vacuum Control
Switch effortlessly between high and low vacuum with Auto LowVac Aperture – ideal for sensitive or challenging samples.
Advanced Sample Handling
Avoid collisions and protect your equipment using the 3D collision model that mirrors sample and detector geometries.
Reproducibility & Ease of Use
TESCAN’s Essence™ Software simplifies operations for users of all levels while ensuring consistent, reproducible results.
MultiVac Mode for Delicate Samples
Analyze oily, outgassing, or degrading materials with minimal preparation, using water vapor to enhance signal and reduce skirting.
Custom Automation with VisualCoder
Design complex experiments effortlessly through block-based programming – no coding experience needed.
Fig. 2, 3: WideField™ image of an Al profile for full-sample overview and navigation, alongside a fractured surface image showcasing ductile fracture in detail.
Fig. 2, 3: WideField™ image of an Al profile for full-sample overview and navigation, alongside a fractured surface image showcasing ductile fracture in detail.
Precision for Every Detail
Explore nanoscale features with clarity using the in-column axial detector, offering exceptional topographical and material contrast. The MIRA XR makes even the most intricate features visible.
Ready for High-Resolution Efficiency?
Contact us to learn how the TESCAN MIRA XR can elevate your materials analysis and transform your lab’s productivity.