Uncover the invisible with advanced electron microscopy.
TEM and STEM open new frontiers in nanoscale imaging and analysis. Whether you’re seeking high-resolution structural insights or detailed elemental maps, these techniques provide complementary solutions for advanced research in materials science, life sciences, and beyond.
TEM – Transmission Electron Microscopy
Explore the nanoscale with ultimate clarity.
Transmission Electron Microscopy (TEM) offers exceptional spatial resolution by transmitting a high-energy electron beam through ultra-thin samples. Ideal for analyzing crystal structures, lattice defects, and internal morphologies, TEM remains a cornerstone technique in materials science, biology, and nanotechnology.
Delong Instruments
STEM – Scanning Transmission Electron Microscopy
High-resolution imaging meets elemental precision.
Scanning Transmission Electron Microscopy (STEM) combines the spatial resolution of TEM with powerful analytical capabilities. By scanning a finely focused electron probe across the sample, STEM delivers atomically resolved images along with advanced compositional mapping via EDX and EELS techniques.
