Scanning Transmission SEM – Advanced Imaging for Nanoscale Research

Scanning Transmission Electron Microscopy (STEM) expands the capabilities of traditional SEM systems by enabling high-resolution transmission imaging. With STEM mode, researchers can achieve superior contrast and enhanced imaging depth, making it an essential tool for studying ultra-thin samples, nanoscale structures, and high-resolution material characterization. STEM-equipped SEMs provide detailed insights into the internal structure of materials, supporting research in nanotechnology, semiconductor analysis, and life sciences.