We are pleased to offer a FEI NOVA Nano SEM 230 field emission scanning electron microscope, available as fully functional second-hand equipment. The system is well maintained and equipped with a wide range of detectors, making it suitable for advanced materials science, nanotechnology, semiconductor, and life science applications.
Key Features and Configuration
The instrument is equipped with multiple detection systems to ensure versatile imaging and analytical performance:
- GAD detector
- BSED detector
- Helix detector
- LVD detector
- vCD detector
The system also includes a fully refurbished EDAX Element EDX detector (30 mm²) with Peltier cooling, providing reliable and high-quality elemental analysis.
For transmission imaging applications, the microscope is fitted with a retractable STEM detector, expanding its analytical capabilities.
Vacuum and Electron Source
The system operates in both high vacuum and low vacuum modes, enabling the examination of a broad range of conductive and non-conductive samples.
It is equipped with:
- Manual control panel
- Scroll pump
- New FEG (Field Emission Gun) module
These features ensure stable performance, high resolution, and long-term reliability.
General Information
Year of manufacture: 2012
The instrument is available for inspection and live demonstration in Vienna. Interested parties are welcome to visit and test the system under real operating conditions.
For further technical details, pricing, or to arrange a viewing appointment, please contact us.
