We offer a fully operational TCS SP2 AOB confocal microscope from Leica Microsystems, previously used …
Latest News
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Opera High Content Screening System (PerkinElmer)We offer a fully operational and automated Opera High Content …
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We are offering a FEI TEM holder as second-hand equipment.Please note that this item is …
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We are offering an Emitech K550X Sputter Coater and Carbon Evaporator System, previously operated at …
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We are offering a FEI Quanta 200 scanning electron microscope as second-hand equipment, available for …
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We are pleased to offer a FEI NOVA Nano SEM 230 field emission scanning electron …
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We are happy to share that we are currently on site at Microplastic Days in …
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Events
Expanding Correlative Microscopy Capabilities: A Unique Raman System at the University of Miskolc
A unique, highly integrated Raman microscopy system has recently been successfully delivered and commissioned at …
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This publication presents a high-impact collaboration between NVIDIA and NenoVision, showcasing how AFM-in-SEM technology fundamentally …
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Publications
Electron-Beam Excited Conductive AFM: Back-Contact-Free Electrical Characterization for Advanced Failure Analysis and Wafer-Scale 2D Materials
This publication presents a novel electrical atomic force microscopy technique—Electron-Beam Excited Conductive AFM (EBC-AFM)—that introduces …