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FEI TEM holder – Spare Part

2026-02-20 0 comments

Emitech K550X – Sputter Coater & Carbon Evaporator System

2026-02-20 0 comments

FEI Quanta 200

2026-02-20 0 comments

FEI NOVA Nano SEM 230

2026-02-20 0 comments

Microplastic Days in Ljubljana – Live from the Conference Floor

2026-02-04 0 comments

Expanding Correlative Microscopy Capabilities: A Unique Raman System at the University of...

2026-01-29 0 comments

Advancing Semiconductor Failure Analysis with In-Situ CAFM: An NVIDIA Case Study

2026-01-29 0 comments

Electron-Beam Excited Conductive AFM: Back-Contact-Free Electrical Characterization for Advanced Failure Analysis and...

2026-01-29 0 comments

TESCAN VEGA acquired by the PPKE Archeometry Group – successful installation through...

2026-01-20 0 comments

Experience the LVEM25E Live – Join Us at Microplastic Days 2026 in...

2026-01-10 0 comments

Nikon Eclipse E200 Fluorescence Microscope Available as a Complete System

2026-01-09 0 comments

See what’s happening at the University of Miskolc – Installation of the...

2025-12-11 0 comments

Latest News

  • 2nd hand equipments

    FEI TEM holder – Spare Part

    by ImageScience Admin 2026-02-20
    2026-02-20

    We are offering a FEI TEM holder as second-hand equipment.Please note that this item is …

  • 2nd hand equipments

    Emitech K550X – Sputter Coater & Carbon Evaporator System

    by ImageScience Admin 2026-02-20
    2026-02-20

    We are offering an Emitech K550X Sputter Coater and Carbon Evaporator System, previously operated at …

  • 2nd hand equipments

    FEI Quanta 200

    by ImageScience Admin 2026-02-20
    2026-02-20

    We are offering a FEI Quanta 200 scanning electron microscope as second-hand equipment, available for …

  • 2nd hand equipments

    FEI NOVA Nano SEM 230

    by ImageScience Admin 2026-02-20
    2026-02-20

    We are pleased to offer a FEI NOVA Nano SEM 230 field emission scanning electron …

  • Events

    Microplastic Days in Ljubljana – Live from the Conference Floor

    by ImageScience Admin 2026-02-04
    2026-02-04

    We are happy to share that we are currently on site at Microplastic Days in …

  • Events

    Expanding Correlative Microscopy Capabilities: A Unique Raman System at the University of Miskolc

    by ImageScience Admin 2026-01-29
    2026-01-29

    A unique, highly integrated Raman microscopy system has recently been successfully delivered and commissioned at …

  • Publications

    Advancing Semiconductor Failure Analysis with In-Situ CAFM: An NVIDIA Case Study

    by ImageScience Admin 2026-01-29
    2026-01-29

    This publication presents a high-impact collaboration between NVIDIA and NenoVision, showcasing how AFM-in-SEM technology fundamentally …

  • Publications

    Electron-Beam Excited Conductive AFM: Back-Contact-Free Electrical Characterization for Advanced Failure Analysis and Wafer-Scale 2D Materials

    by ImageScience Admin 2026-01-29
    2026-01-29

    This publication presents a novel electrical atomic force microscopy technique—Electron-Beam Excited Conductive AFM (EBC-AFM)—that introduces …

  • Events

    TESCAN VEGA acquired by the PPKE Archeometry Group – successful installation through National Museum collaboration

    by ImageScience Admin 2026-01-20
    2026-01-20

    We are pleased to share the recent installation of a new TESCAN VEGA scanning electron …

  • Events

    Experience the LVEM25E Live – Join Us at Microplastic Days 2026 in Ljubljana!

    by ImageScience Admin 2026-01-10
    2026-01-10

    We are pleased to invite you to Microplastic Days 2026, taking place in February 2026 …

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Image Science
  • Products
    • Scanning Electron Microscope
      • Stand Alone SEM
      • Tabletop SEMs
      • SEM special solutions
    • Scanning Transmission (STEM)
    • Transmission Electron Microscope
    • Atomic Force Microscope
      • LiteScope 2.5
    • Confocal/Super-resolution microscopy
      • Re-scanning confocal unit (Confocal)
      • Unity stand-alone microscope (AUROX)
      • Clarity spinning disc upgrade (AUROX)
      • Telight LiveCodim
      • Oxford nanoimager
    • 2-photon microscopy
      • Transcend Supernova‑100
      • Transcend Supernova‑600
      • Transcend Supernova‑3000
    • Microtomes
      • Ultramicrotomes (RMC Boeckler)
      • Rotary Microtomes (RMC Boeckeler)
    • Micro-CT
      • TESCAN CoreTOM
      • TESCAN UniTOM XL
      • TESCAN UniTOM HR
      • TESCAN DynaTOM
      • TESCAN SPECTRAL CT
    • Elemental Analysis
      • AtomTrace LIBS
      • LECO Laboratory Equipment And Scientific Instrumentation
    • Sample Preparation Equipments
      • Workflow Instruments (RMC Boeckeler)
      • UniMill for TEM users
      • GentleMill for TEM users
      • SEMPrep 2
      • Microsaw
      • Micropol
      • COXEM Ion Sputter Coater SPT-20
    • Accessories
      • Incubation Chamber for Microscope
      • Nanoindentation
    • Raman microscopy
      • Raman microscopy
      • Renishaw Strada®
    • Light-Sheet Microscope
    • Renishaw CMM Measurement Solutions
  • Software
    • Mountains product range
      • Multi-instrument
      • Profilometry
      • Scanning Electron Microscopy
      • Scanning Probe Microscopy
      • Correlation and spectroscopy imaging
      • Light Microscopy
      • Mountains optional modules
    • GeoDict – The Digital Material Laboratory
      • Digital Solutions for Battery Research & Development
      • Digital Material Development for Fuel Cells
      • Digital development of materials for Filtration
      • Simulations in Digital Rock Physics & Digital Core Analysis
      • Digital Material Research & Development
      • Additive Manufacturing Processes Simulated with GeoDict
      • Solutions for 3D Image Processing and Image Analysis
  • Services
    • Precision Measurement & Consultation Services
    • Report a Malfunction
    • Warranty & Maintenance Packages
      • Warranty & Maintenance Packages for TESCAN SEM
      • Renishaw Raman instrument service and maintenance plans
  • 2nd hand equipments
  • Events
  • Publications
  • About Us
  • Contact