Serial Block Face Imaging – SBFI

by Gergely Balogh

Serial block-face SEM

In serial block-face imaging, a microtome resides inside the vacuum chamber of an SEM. A diamond knife repeatedly removes a thin surface layer from the sample block. The removed layer can be as thin as 15 nm. After each sectioning, the exposed block surface is imaged. This automated in situ method can acquire a series of electron micrographs over a large volume.

An ultra-micro ultramicrotome

At a mere 56 mm in height, katana ultramicrotome is designed to fit inside the vacuum chamber of many SEMs. Easy installation has been at the heart of our design. The microtome can be attached to / removed from an SEM stage by a lever mechanism. All electronic signals are fed through a vacuum flange via a single connector. The user friendly design enables a quick and easy switch from your normal SEM to a volume SEM and back.

Confirmed compatible SEMs

FEI Quanta 200, FEI Quanta 250, FEI Helios NanoLab 650,

Zeiss Simga VP, Zeiss Merlin compact, Zeiss Merlin

TESCAN S8000, TESCAN S9000, TESCAN VEGA, TESCAN MIRA, TESCAN CLARA (GM chambers)

JEOL JSM-7200F

 
 
 
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