Ultra-High-Resolution SEM-EDS for Accelerated Materials Science
The ultimate scanning electron microscope solution for multi-user laboratories, research institutions, and industrial quality control.
Push the Boundaries of Imaging and Analysis
The TESCAN MIRA XR is a cutting-edge SEM-EDS system engineered to deliver unparalleled imaging resolution and analytical performance. With a focus on high throughput, intuitive operation, and flexibility, it empowers researchers and engineers to conduct fast, accurate, and reproducible materials analysis, even in the most demanding environments.
Whether you’re investigating fracture surfaces, beam-sensitive specimens, or large-scale structural features, the MIRA XR ensures you stay ahead—with minimal preparation and maximum efficiency.
Faster, Ultra-High-Resolution Data
Thanks to Dual Essence™ EDS and Extended Resolution technology, users gain access to fast, high-resolution imaging and compositional data- shortening the time from acquisition to insight.
Efficient
Sample Analysis
With Wide Field Optics™, navigating across large sample surfaces becomes significantly faster—cutting time-to-data by as much as 30% and enabling users to reach critical regions effortlessly.
Seamless Handling of Complex Samples
MultiVac™ mode allows for high-quality imaging of challenging samples—including those that are delicate, outgassing, or non-conductive—without the need for conductive coatings.
Smart
Automation
In-Flight™ beam optimization and intuitive Essence™ software simplify even the most advanced SEM tasks, allowing users of all experience levels to operate with confidence and consistency.
Fig. 2, 3: WideField™ image of an Al profile for full-sample overview and navigation, alongside a fractured surface image showcasing ductile fracture in detail.
Fig. 2, 3: WideField™ image of an Al profile for full-sample overview and navigation, alongside a fractured surface image showcasing ductile fracture in detail.
Performance at Every Scale
High-resolution imaging, fast elemental analysis, and versatile sample handling in one powerful system. Discover how MIRA XR streamlines your analysis:
The TESCAN MIRA XR delivers exceptional analytical performance across all magnification levels, from micron-scale structures to sub-nanometer surface features. Its ultra-high-resolution field emission gun (FEG) and in-column Axial detector capture even the finest topographic or material contrast details. When paired with the fully integrated Dual Essence™ EDS, MIRA XR allows users to generate fast, precise elemental maps and spectra—significantly shortening analysis cycles. Whether you’re conducting compositional analysis, failure localization, or morphological characterization, the system’s In-Flight™ beam automation ensures optimal imaging and analytical conditions are maintained automatically.
Moreover, MultiVac™ technology expands your analytical capabilities by enabling high-quality imaging of delicate, beam-sensitive, or non-conductive samples without the need for coating—saving time and preserving the sample’s integrity. With every function designed for analytical speed, accuracy, and repeatability, MIRA XR transforms how you approach materials analysis.
Smart Automation, Seamless Control
MIRA XR simplifies advanced SEM imaging with intelligent automation and intuitive workflows.
Explore how MIRA XR enhances usability and efficiency for every user:
Built with the needs of modern multi-user labs in mind, MIRA XR combines intelligent automation with user-centered design. The Essence™ software platform offers a streamlined interface that simplifies even complex imaging procedures, reducing the learning curve and ensuring consistent results regardless of operator experience. The system’s In-Flight™ Automation Controls dynamically adjust beam parameters in real time, eliminating the need for manual optimization and enabling smooth transitions between imaging and analysis modes.
VisualCoder, the system’s block-based automation interface, empowers users to create and execute custom experimental workflows without requiring programming skills—ideal for academic labs or high-throughput industrial settings. With built-in safety features like the 3D collision model and Auto LowVac Aperture, MIRA XR also ensures operational reliability and sample protection. Altogether, this smart ecosystem transforms advanced SEM imaging into a seamless and accessible process, enabling every user to focus on discovery, not complexity.
Designed for Academic and Industrial Labs
From failure analysis to advanced materials research, MIRA XR adapts to diverse scientific and industrial needs.
See how MIRA XR supports various applications:
The versatility of the MIRA XR makes it an ideal solution across a broad spectrum of applications, from academia to industry. In university research labs, it serves as a reliable platform for fundamental studies in nanostructures, composite materials, or complex surfaces. Its intuitive software and robust automation make it accessible to students and researchers alike, supporting a wide range of academic projects. In industrial environments, MIRA XR meets the rigorous demands of failure analysis, quality assurance, and production support. The fast navigation and large-area imaging powered by Wide Field Optics™ reduce inspection times, while the high-speed EDS integration delivers reliable results in fast-paced workflows.
Whether analyzing fracture modes in metal alloys, identifying contamination on microelectronic components, or conducting microstructural studies in ceramics and polymers, MIRA XR provides the speed, precision, and adaptability required for multidisciplinary success.
TESCAN MIRA XR Designed for Usability and Productivity
Built for multi-user labs, the MIRA XR incorporates innovations that reduce training time, prevent operator errors, and accelerate workflows. Whether you’re a novice or an experienced microscopist, the user-centered interface ensures rapid proficiency and consistently high-quality results.
With automated alignments, smart navigation tools, and integration-ready software, TESCAN MIRA XR meets the evolving demands of materials science and industrial research alike.
Discover What the MIRA XR Can Do for You!
Ready to revolutionize your materials analysis workflows?
Request a consultation today and let our experts guide you through the advantages of the TESCAN MIRA XR platform.