TESCAN VOLUME SEM – Unlock the Power of 3D Biological Imaging
High-Resolution Insights into Biological Structures
Volume SEM methods provide insights into our samples in high resolution that allows researchers to comprehensively understand the internal structure and functioning of their systems in 3D.
Microscope flexibility, throughput and ease of use are of utmost importance for instruments in core facilities and imaging centers. Therefore, TESCAN volume SEMs are designed to be fully operational after only a short training session. This is possible with our modular Essence™ GUI that is configurable and predefined for specific applications. Quality of results is assured by streamlining the process from easy acquisition setup through to data processing, machine-learning assisted segmentation and visualization in a single, unified TESCAN software environment.
Key Features of TESCAN VOLUME SEM
- Extend your SEM for to perform Volume SEM analysis
- Obtain greater contrast from your samples.
Use dedicated low energy BSE detector optimized for volume SEM application. The highly efficient detection system shortens the time of analysis and increases throughput, thus speed up your data acquisition. - Acquire multiple regions of interest easily. SBEMimage is an open-source Python application to run acquisitions with serial block-face imaging allowing advanced multi-ROI analysis
- Visualise your data intuitively without effort. Import, process and visualize 3D image data with TESCAN Volume Analysis software. This simple but powerful three-dimensional data processing tool utilizes guided, optimized workflows for quick import, processing, AI assisted segmentation and visualizing your 3D datasets
- Enjoy high flexibility and usability of your microscope. The unmatched versatility of TESCAN SEMs fits the needs of most users in core facilities or other research institutes
The 2D imaging capability of almost any SEM can be expanded to a 3rd dimension with specialized software or hardware. Method of choice depends on the priority and character of the sample.
Thin section of mouse brain on silicon wafer imaged with BSE detector, inverted contrast. Image courtesy: Dr. Rudolph Reimer, Leibniz Institute of Virology.
Flatworm Macrostomum lignano, visualization of volume dataset acquired by SBF-SEM with segmented cilia (green) and rhabdites (blue)
Tobacco stem volume acquired by array tomography and visualised in TESCAN VOLUME ANALYSIS software
TESCAN VOLUME SEM SOLUTIONS
1.In-Chamber Microtome Slicing & Imaging (SBF-SEM)
Serial Block Face – SEM (SBF-SEM) utilizes an in-chamber microtome to allow large volume analysis by in-situ sectioning and imaging of samples. Samples are usually resin-embedded blocks of cells, tissues or small organisms. SBF-SEM is used for larger volumes as it enables slicing of areas as wide as 1mm enabling multiple regions of interest to be acquired during the run. Precise microtome slicing through the sample together with an efficient detection system allows for the acquisition of large datasets with a modest Z resolution in a reasonable time with swift reconfiguration back to a normal SEM regime when the acquisition is complete. This allows us to understand the complex structural organization of cells, tissues, organs and organisms, and relationships over a large distance, such as animal connectomes.
Serial block-face SEM
In serial block-face imaging, a microtome resides inside the vacuum chamber of an SEM. A diamond knife repeatedly removes a thin surface layer from the sample block. The removed layer can be as thin as 15 nm. After each sectioning, the exposed block surface is imaged. This automated in situ method can acquire a series of electron micrographs over a large volume.
An ultra-micro ultramicrotome
At a mere 56 mm in height, katana ultramicrotome is designed to fit inside the vacuum chamber of many SEMs. Easy installation has been at the heart of our design. The microtome can be attached to / removed from an SEM stage by a lever mechanism. All electronic signals are fed through a vacuum flange via a single connector. The user friendly design enables a quick and easy switch from your normal SEM to a volume SEM and back.
Confirmed compatible SEMs
FEI Quanta 200, FEI Quanta 250, FEI Helios NanoLab 650,
Zeiss Simga VP, Zeiss Merlin compact, Zeiss Merlin
TESCAN S8000, TESCAN S9000, TESCAN VEGA, TESCAN MIRA, TESCAN CLARA (GM chambers)
JEOL JSM-7200F
2.Array Tomography – Ultra-Thin Sectioning for High-Resolution Imaging
In Array Tomography, ultrathin sections of resin-embedded biological samples are sliced using an ultramicrotome and then mounted onto silicon wafers outside the SEM chamber. The resulting sectioned array is automatically scanned for 3D reconstruction.
Key Advantages:
- Non-destructive approach – preserves samples for future reference
- Ideal for immuno-labeling of sections
- No need for specialized SEM hardware – streamlined software guides users through data acquisition and reconstruction
For Array Tomography ultramicrotome systems, please visit our website:
3.FIB-SEM tomography
Focused Ion Beam-Scanning Electron Microscopy (FIB-SEM) is a pivotal tool in the field of materials science, enabling detailed examination and manipulation of materials for a variety of applications.
Unveiling the Hidden Worlds Within Materials with 3D FIB-SEM
Understanding the internal structure and properties of materials like batteries, metals, and composites in three dimensions is crucial in materials science. To derive meaningful conclusions, the 3D volume must accurately reflect the sample’s structure at an appropriate scale.
3D Multimodal Characterization with Unmatched Speed and Precision
Meet Mistral™ – the most precise and powerful plasma FIB on the market. Engineered for applications demanding precision, like TEM sample preparation. Mistral™ offers optimized resolution and the highest beam current at the same time. Whether you’re working with high or low currents, Mistral™ delivers the best resolution across all settings.
Challenging materials? No problem.
Hard and soft material mixes, excessive topography or preferential sample orientation can create poor FIB-cut surface quality. TESCAN’s Rocking Stage and True X-Sectioning enable fast cross-sectioning and 3D analysis without compromising throughput or surface quality.
TESCAN Rocking Stage
TESCAN Rocking Stage is fully compatible with TESCAN hardware and software to create an integrated solution for more efficient workflow execution and improved milling speed, accuracy and quality.
TESCAN True X-Sectioning
TESCAN’s TRUE X-Sectioning employs a masking principle for large-scale (above 200×200 µm²) 3D characterization tasks, where conventional deposition methods are significantly slower and impractical. This approach allows for higher beam currents, speeding up the entire characterization process.
Essence Tomography – 3D Nanotomography. Effortless, but mighty.
Specify the volume of interest. Define your acquisition parameters or follow our step-by-step guided workflows, then begin data collection. TESCAN’s Essence Tomography module makes it fast and straightforward for any operator to successfully perform 3D sample analysis.
And TESCAN’s own powerful 3D rendering engine delivers high-quality visualizations with several viewing options and exports comprehensive rendered animations.
Versatility Meets Precision
Discover the TESCAN Essence Multimodal FIB-SEM Tomography, seamlessly integrated into Amber X 2’s Essence™ graphical user interface. This advanced tomography module supports a wide range of imaging and analytical detectors, offering unmatched versatility and precision for your imaging needs.
3D EDS and EBSD
Always Accurate. Always Fast.
Understand relationships between structure, composition, and crystallography – even in 3D. Our patented static setup for FIB-SEM slicing and 3D tomographic data acquisition ensures large volume 3D EBSD analysis that is both reliable and fast. Experience unparalleled efficiency and accuracy in every slice and dataset.
TESCAN 3D Viewer software
TESCAN’s 3D Viewer module is easy to learn, so both new and experienced users can produce complex 3D visualizations quickly. A step-by-step wizard guides the operator through the import, alignment, and pre-processing steps in their correct sequence, resulting in complete, detailed output for 3D visualization.
3D Investigation of New Battery Technology Material Structure and Chemistry
Understanding the structure and chemical composition of battery materials is pivotal to determining the behavior and stability of new battery chemistries during the cycling process. Grasping the complex relationship between local morphology and chemical state, such as particle, void, lithium, and binder distribution within electrodes, is vital for performance optimization and degradation resistance for these advanced battery materials.
By utilizing 3D FIB-SEM tomography combined with ToF-SIMS analysis, we can conduct detailed investigations of the material composition in new battery technologies. This 3D approach delivers more precise volumetric statistical data than traditional ToF-SIMS depth profiling. Moreover, 3D ToF-SIMS tomography aids in pinpointing contaminants, vulnerabilities, and chemical inconsistencies within the battery components.
3D ToF-SIMS: Beyond Battery Research
Use the power of 3D FIB-SEM tomography combined with ToF-SIMS analysis for a thorough examination of emerging materials. This method offers more accurate volumetric statistical information compared to conventional 2D ToF-SIMS depth profiling. 3D ToF-SIMS tomography is not only crucial for advancing battery technology but also holds promise for other areas of Materials Science, enabling precise mapping of specific elements, isotopes, or trace elements.