This publication presents a high-impact collaboration between NVIDIA and NenoVision, showcasing how AFM-in-SEM technology fundamentally …
-
-
Publications
Electron-Beam Excited Conductive AFM: Back-Contact-Free Electrical Characterization for Advanced Failure Analysis and Wafer-Scale 2D Materials
This publication presents a novel electrical atomic force microscopy technique—Electron-Beam Excited Conductive AFM (EBC-AFM)—that introduces …
-
Events
TESCAN VEGA acquired by the PPKE Archeometry Group – successful installation through National Museum collaboration
We are pleased to share the recent installation of a new TESCAN VEGA scanning electron …
-
We are pleased to invite you to Microplastic Days 2026, taking place in February 2026 …
-
We are pleased to present the Nikon Eclipse E200 fluorescence light microscope, a reliable and …
-
Events
See what’s happening at the University of Miskolc – Installation of the new Raman–AFM–FLIM system
See what’s happening at the University of Miskolc – Installation of the new Raman–AFM–FLIM systemWe …
-
Events
Image-Science at the MAJOSZ Automotive Conference – Insights, Innovation and Industry Connections
We were pleased to participate in this year’s MAJOSZ Automotive Conference at ZalaZONE, an inspiring …
-
We were delighted to participate as an exhibitor at the OATK 2025 Conference, held October …
-
We are proud to announce the upcoming installation of a new TESCAN VEGA Scanning Electron …
-
We are delighted to announce the upcoming installation of a combined AFM–Raman–FLIM system at the …