We are offering a FEI Quanta 200 scanning electron microscope as second-hand equipment, available for …
We are pleased to offer a FEI NOVA Nano SEM 230 field emission scanning electron …
We are happy to share that we are currently on site at Microplastic Days in …
- Events
Expanding Correlative Microscopy Capabilities: A Unique Raman System at the University of Miskolc
A unique, highly integrated Raman microscopy system has recently been successfully delivered and commissioned at …
This publication presents a high-impact collaboration between NVIDIA and NenoVision, showcasing how AFM-in-SEM technology fundamentally …
- Publications
Electron-Beam Excited Conductive AFM: Back-Contact-Free Electrical Characterization for Advanced Failure Analysis and Wafer-Scale 2D Materials
This publication presents a novel electrical atomic force microscopy technique—Electron-Beam Excited Conductive AFM (EBC-AFM)—that introduces …
- Events
TESCAN VEGA acquired by the PPKE Archeometry Group – successful installation through National Museum collaboration
We are pleased to share the recent installation of a new TESCAN VEGA scanning electron …
We are pleased to invite you to Microplastic Days 2026, taking place in February 2026 …
We are pleased to present the Nikon Eclipse E200 fluorescence light microscope, a reliable and …
- Events
See what’s happening at the University of Miskolc – Installation of the new Raman–AFM–FLIM system
See what’s happening at the University of Miskolc – Installation of the new Raman–AFM–FLIM systemWe …